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Material characterization

  • SEM System (FEI Inspect 50) with EDX and CL (UV-VIS-IR)
  • High Resolution XRD
  • Bruker Fastscan AFM with MFM
  • Micro-Raman Spectrometer UV-VIS-IR 10-300K (LabRAM HR Evolution)
  • Micro-PL UV-VIS-IR 10-300K
  • Bruker Invenio-S FTIR Spectrometer
  • UV-VIS Spectrophotometer
  • Hall Effect 10-300K vs. Field
  • DLTS-DLOS Spectroscopy
  • CV Profiling
  • VSM (Lakeshore 7304)
  • Alternating Gradient Field Magnetometer (PMC Micromag 2900)
  • Nuclear Magnetic Resonance Relaxometer (Stellar SMARtracer)